Jaehyun Jeong, Tetsuya Iizuka, Toru Nakura, Makoto Ikeda, Kunihiro Asada. All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 79-80, IEEE, 2011. [doi]
@inproceedings{JeongINIA11,
title = {All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter},
author = {Jaehyun Jeong and Tetsuya Iizuka and Toru Nakura and Makoto Ikeda and Kunihiro Asada},
year = {2011},
doi = {10.1109/ASPDAC.2011.5722297},
url = {http://dx.doi.org/10.1109/ASPDAC.2011.5722297},
tags = {process monitoring},
researchr = {https://researchr.org/publication/JeongINIA11},
cites = {0},
citedby = {0},
pages = {79-80},
booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011},
publisher = {IEEE},
isbn = {978-1-4244-7516-2},
}