Jaehyun Jeong, Tetsuya Iizuka, Toru Nakura, Makoto Ikeda, Kunihiro Asada. All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 79-80, IEEE, 2011. [doi]
Abstract is missing.