Gyohun Jeong, Sangmin Kim, Hyelyun Kim, Sunghee Lee. A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-2, IEEE, 2022. [doi]
@inproceedings{JeongKKL22,
title = {A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage},
author = {Gyohun Jeong and Sangmin Kim and Hyelyun Kim and Sunghee Lee},
year = {2022},
doi = {10.1109/ETS54262.2022.9810424},
url = {https://doi.org/10.1109/ETS54262.2022.9810424},
researchr = {https://researchr.org/publication/JeongKKL22},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6706-3},
}