Enhancing Multiple Reliability Measures via Nuisance-Extended Information Bottleneck - researchr publication authors

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Jongheon Jeong, Sihyun Yu, Hankook Lee, Jinwoo Shin. Enhancing Multiple Reliability Measures via Nuisance-Extended Information Bottleneck. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 16206-16218, IEEE, 2023. [doi]

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