Jongheon Jeong, Sihyun Yu, Hankook Lee, Jinwoo Shin. Enhancing Multiple Reliability Measures via Nuisance-Extended Information Bottleneck. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 16206-16218, IEEE, 2023. [doi]
Abstract is missing.