A Dynamic Credibility Model with Self-Excitation and Exponential Decay

Himchan Jeong, Bin Zou. A Dynamic Credibility Model with Self-Excitation and Exponential Decay. In Winter Simulation Conference, WSC 2022, Singapore, December 11-14, 2022. pages 3241-3250, IEEE, 2022. [doi]

Abstract

Abstract is missing.