A Comprehensive Dependability Model for QoM-Aware Industrial WSN When Performing Visual Area Coverage in Occluded Scenarios

Thiago C. Jesus, Paulo Portugal, Daniel G. Costa, Francisco Vasques. A Comprehensive Dependability Model for QoM-Aware Industrial WSN When Performing Visual Area Coverage in Occluded Scenarios. Sensors, 20(22):6542, 2020. [doi]

Abstract

Abstract is missing.