Pranay Jhunjhunwala, Jan Olaf Blech, Alois Zoitl, Udayanto Dwi Atmojo, Valeriy Vyatkin. A Design Pattern for Monitoring Adapter Connections in IEC 61499. In 22nd IEEE International Conference on Industrial Technology, ICIT 2021, Valencia, Spain, March 10-12, 2021. pages 967-972, IEEE, 2021. [doi]
@inproceedings{JhunjhunwalaBZA21,
title = {A Design Pattern for Monitoring Adapter Connections in IEC 61499},
author = {Pranay Jhunjhunwala and Jan Olaf Blech and Alois Zoitl and Udayanto Dwi Atmojo and Valeriy Vyatkin},
year = {2021},
doi = {10.1109/ICIT46573.2021.9453685},
url = {https://doi.org/10.1109/ICIT46573.2021.9453685},
researchr = {https://researchr.org/publication/JhunjhunwalaBZA21},
cites = {0},
citedby = {0},
pages = {967-972},
booktitle = {22nd IEEE International Conference on Industrial Technology, ICIT 2021, Valencia, Spain, March 10-12, 2021},
publisher = {IEEE},
isbn = {978-1-7281-5730-6},
}