Robust avalanche in GaN leading to record performance in avalanche photodiode - researchr publication authors

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Dong Ji, Burcu Ercan, Garret Benson, A. K. M. Newaz, Srabanti Chowdhury. Robust avalanche in GaN leading to record performance in avalanche photodiode. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]

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