Y. Ji, H. J. Goo, J. Lim, T. Y. Jeong, T. Uemura, G. R. Kim, B. I. Seo, S. Lee, G. Park, J. Jo, S. I. Han, K. Lee, J. Lee, S.-H. Hwang, D.-S. Lee, S. Pyo, H. T. Jung, S.-H. Han, S. Noh, K. Suh, S. Y. Yoon, H. Nam, H. Hwang, H. Jiang, J. W. Kim, D. Kwon, Y. J. Song, K. H. Koh, H. S. Rhee, Sangwoo Pae, E. Lee. Reliability of Industrial grade Embedded-STT-MRAM. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-3, IEEE, 2020. [doi]
@inproceedings{JiGLJUKSLPJHLLH20,
title = {Reliability of Industrial grade Embedded-STT-MRAM},
author = {Y. Ji and H. J. Goo and J. Lim and T. Y. Jeong and T. Uemura and G. R. Kim and B. I. Seo and S. Lee and G. Park and J. Jo and S. I. Han and K. Lee and J. Lee and S.-H. Hwang and D.-S. Lee and S. Pyo and H. T. Jung and S.-H. Han and S. Noh and K. Suh and S. Y. Yoon and H. Nam and H. Hwang and H. Jiang and J. W. Kim and D. Kwon and Y. J. Song and K. H. Koh and H. S. Rhee and Sangwoo Pae and E. Lee},
year = {2020},
doi = {10.1109/IRPS45951.2020.9129178},
url = {https://doi.org/10.1109/IRPS45951.2020.9129178},
researchr = {https://researchr.org/publication/JiGLJUKSLPJHLLH20},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}