Byeongmoon Ji, Hyemin Jung, Jihyeun Yoon, Kyungyul Kim, Younghak Shin. Bin-wise Temperature Scaling (BTS): Improvement in Confidence Calibration Performance through Simple Scaling Techniques. In 2019 IEEE/CVF International Conference on Computer Vision Workshops, ICCV Workshops 2019, Seoul, Korea (South), October 27-28, 2019. pages 4190-4196, IEEE, 2019. [doi]
Abstract is missing.