Suhwan Ji, Sanghwa Lee, Changsup Lee, Yo-Sub Han, Hyeonseung Im. Impact of Large Language Models of Code on Fault Localization. In IEEE Conference on Software Testing, Verification and Validation, ICST 2025, Napoli, Italy, March 31 - April 4, 2025. pages 302-313, IEEE, 2025. [doi]
Abstract is missing.