Yi Ji, Ryan Lekivetz, Simon Mak, Joseph Morgan. BayesFLo: Bayesian Fault Localization for Software Testing. In 23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023 Companion, Chiang Mai, Thailand, October 22-26, 2023. pages 865-866, IEEE, 2023. [doi]
@inproceedings{JiLMM23,
title = {BayesFLo: Bayesian Fault Localization for Software Testing},
author = {Yi Ji and Ryan Lekivetz and Simon Mak and Joseph Morgan},
year = {2023},
doi = {10.1109/QRS-C60940.2023.00019},
url = {https://doi.org/10.1109/QRS-C60940.2023.00019},
researchr = {https://researchr.org/publication/JiLMM23},
cites = {0},
citedby = {0},
pages = {865-866},
booktitle = {23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023 Companion, Chiang Mai, Thailand, October 22-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-5939-8},
}