Yi Ji, Ryan Lekivetz, Simon Mak, Joseph Morgan. BayesFLo: Bayesian Fault Localization for Software Testing. In 23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023 Companion, Chiang Mai, Thailand, October 22-26, 2023. pages 865-866, IEEE, 2023. [doi]
Abstract is missing.