A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions

Yi Ji, Simon Mak, Derek Soeder, Jean-François Paquet, Steffen A. Bass. A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions. Technometrics, 66(2):267-281, April 2024. [doi]

Abstract

Abstract is missing.