ISA: Test Case Generation Based on Improved Simulated Annealing Algorithm

Shunhui Ji, Yu Shi, Ji Deng, Pengcheng Zhang. ISA: Test Case Generation Based on Improved Simulated Annealing Algorithm. In 32nd Asia-Pacific Software Engineering Conference, APSEC 2025, Macau, China, December 2-5, 2025. pages 23-34, IEEE, 2025. [doi]

Abstract

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