Linlin Jia, Benoit Gaüzère, Florian Yger, Paul Honeine. A Metric Learning Approach to Graph Edit Costs for Regression. In Andrea Torsello, Luca Rossi 0004, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly, editors, Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings. Volume 12644 of Lecture Notes in Computer Science, pages 238-247, Springer, 2020. [doi]
@inproceedings{JiaGYH20,
title = {A Metric Learning Approach to Graph Edit Costs for Regression},
author = {Linlin Jia and Benoit Gaüzère and Florian Yger and Paul Honeine},
year = {2020},
doi = {10.1007/978-3-030-73973-7_23},
url = {https://doi.org/10.1007/978-3-030-73973-7_23},
researchr = {https://researchr.org/publication/JiaGYH20},
cites = {0},
citedby = {0},
pages = {238-247},
booktitle = {Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings},
editor = {Andrea Torsello and Luca Rossi 0004 and Marcello Pelillo and Battista Biggio and Antonio Robles-Kelly},
volume = {12644},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-73973-7},
}