Linlin Jia, Benoit Gaüzère, Florian Yger, Paul Honeine. A Metric Learning Approach to Graph Edit Costs for Regression. In Andrea Torsello, Luca Rossi 0004, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly, editors, Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings. Volume 12644 of Lecture Notes in Computer Science, pages 238-247, Springer, 2020. [doi]
Abstract is missing.