Ruolan Jia, Stefan Pechmann, Andrea Baroni, Christian Wenger, Amelie Hagelauer. A RRAM Characterization System with Flexible Readout Operations using an Integrating ADC. In 18th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2023, Valencia, Spain, June 18-21, 2023. pages 245-248, IEEE, 2023. [doi]
@inproceedings{JiaPBWH23,
title = {A RRAM Characterization System with Flexible Readout Operations using an Integrating ADC},
author = {Ruolan Jia and Stefan Pechmann and Andrea Baroni and Christian Wenger and Amelie Hagelauer},
year = {2023},
doi = {10.1109/PRIME58259.2023.10161880},
url = {https://doi.org/10.1109/PRIME58259.2023.10161880},
researchr = {https://researchr.org/publication/JiaPBWH23},
cites = {0},
citedby = {0},
pages = {245-248},
booktitle = {18th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2023, Valencia, Spain, June 18-21, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0320-9},
}