Ruolan Jia, Stefan Pechmann, Andrea Baroni, Christian Wenger, Amelie Hagelauer. A RRAM Characterization System with Flexible Readout Operations using an Integrating ADC. In 18th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2023, Valencia, Spain, June 18-21, 2023. pages 245-248, IEEE, 2023. [doi]
Abstract is missing.