An Improvement in Image Registration with SIFT Features and Logistic Regression

Yongxing Jia, Weihao Sun, Chuanzhen Rong, Ying Zhu, Yu Yang. An Improvement in Image Registration with SIFT Features and Logistic Regression. In Wei Li, Qingli Li, Lipo Wang, editors, 11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018. pages 1-5, IEEE, 2018. [doi]

@inproceedings{JiaSRZY18,
  title = {An Improvement in Image Registration with SIFT Features and Logistic Regression},
  author = {Yongxing Jia and Weihao Sun and Chuanzhen Rong and Ying Zhu and Yu Yang},
  year = {2018},
  doi = {10.1109/CISP-BMEI.2018.8633020},
  url = {https://doi.org/10.1109/CISP-BMEI.2018.8633020},
  researchr = {https://researchr.org/publication/JiaSRZY18},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018},
  editor = {Wei Li and Qingli Li and Lipo Wang},
  publisher = {IEEE},
  isbn = {978-1-5386-7604-2},
}