An Improvement in Image Registration with SIFT Features and Logistic Regression

Yongxing Jia, Weihao Sun, Chuanzhen Rong, Ying Zhu, Yu Yang. An Improvement in Image Registration with SIFT Features and Logistic Regression. In Wei Li, Qingli Li, Lipo Wang, editors, 11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018. pages 1-5, IEEE, 2018. [doi]

Abstract

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