Detecting JVM JIT Compiler Bugs via Exploring Two-Dimensional Input Spaces

Haoxiang Jia, Ming Wen 0001, Zifan Xie, Xiaochen Guo, Rongxin Wu, Maolin Sun, Kang Chen, Hai Jin 0001. Detecting JVM JIT Compiler Bugs via Exploring Two-Dimensional Input Spaces. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 43-55, IEEE, 2023. [doi]

Abstract

Abstract is missing.