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Sparse Voltage Measurement-Based Fault Location Using Intelligent Electronic Devices

Ke Jia, Bin Yang, Xiongying Dong, Tao Feng, Tianshu Bi, David W. P. Thomas. Sparse Voltage Measurement-Based Fault Location Using Intelligent Electronic Devices. IEEE Trans. Smart Grid, 11(1):48-60, 2020. [doi]

Authors

Ke Jia

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Bin Yang

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Xiongying Dong

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Tao Feng

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Tianshu Bi

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David W. P. Thomas

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