Study on Test Generation of Sequential Circuits Based on Particle Swarm Optimization and Ant Algorithm

Wang Jian, Xu Chuanpei. Study on Test Generation of Sequential Circuits Based on Particle Swarm Optimization and Ant Algorithm. In International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 1: Artificial Intelligence, December 12-14, 2008, Wuhan, China. pages 149-152, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.