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Xun Jian, Rakesh Kumar. Adaptive Reliability Chipkill Correct (ARCC). In 19th IEEE International Symposium on High Performance Computer Architecture, HPCA 2013, Shenzhen, China, February 23-27, 2013. pages 270-281, IEEE Computer Society, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/CorrectXun Jian, Nathan DeBardeleben, Sean Blanchard, Vilas Sridharan, Rakesh Kumar 0002. prdc 2013: 88-97 [doi]
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