A Novel Nonlocal Low Rank Technique for Fabric Defect Detection

Jielin Jiang, Yan Cui, Yadang Chen, Guangwei Gao. A Novel Nonlocal Low Rank Technique for Fabric Defect Detection. In Xingming Sun, Zhaoqing Pan, Elisa Bertino, editors, Cloud Computing and Security - 4th International Conference, ICCCS 2018, Haikou, China, June 8-10, 2018, Revised Selected Papers, Part IV. Volume 11066 of Lecture Notes in Computer Science, pages 173-182, Springer, 2018. [doi]

Abstract

Abstract is missing.