The following publications are possibly variants of this publication:
- A Method of Gate-Level Circuit Reliability Estimation Based on Iterative PTM ModelJie Xiao, Jianhui Jiang, Xuguang Zhu, Chengtian Ouyang. prdc 2011: 276-277 [doi]
- Circuit reliability estimation based on an iterative PTM model with hybrid codingJie Xiao, William Lee, Jianhui Jiang, Xuhua Yang. mj, 52:117-123, 2016. [doi]
- Methods for Approximate Adders Reliability Estimation Based on PTM ModelJianhui Jiang, Guangming Lu, Zhen Wang. prdc 2018: 221-222 [doi]