Min Norm Failure Vector Guided Yield Optimization Method for Nanometer SRAM Design

Chengzhi Jiang, Xiaoming Fan, Yan Xing, Chao Duan, Jiaqi Zhang. Min Norm Failure Vector Guided Yield Optimization Method for Nanometer SRAM Design. In Mohammad S. Obaidat, Zhenqiang Mi, Kuei-Fang Hsiao, Petros Nicopolitidis, Daniel Cascado Caballero, editors, 2019 International Conference on Computer, Information and Telecommunication Systems, CITS 2019, Beijing, China, August 28-31, 2019. pages 1-4, IEEE, 2019. [doi]

Abstract

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