An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Zhigang Jiang, Sandeep K. Gupta. An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 824-833, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Zhigang Jiang' in GoogleThis author has not been identified. Look up 'Sandeep K. Gupta' in Google

runs on WebDSL