Xiaohong Jiang, Susumu Horiguchi, Yue Hao. Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 30, IEEE Computer Society, 2000. [doi]
@inproceedings{JiangHH00,
title = {Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core},
author = {Xiaohong Jiang and Susumu Horiguchi and Yue Hao},
year = {2000},
url = {http://computer.org/proceedings/dft/0719/07190030abs.htm},
researchr = {https://researchr.org/publication/JiangHH00},
cites = {0},
citedby = {0},
pages = {30},
booktitle = {15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-0719-0},
}