Jiang Jiang, Haicheng Tu, Yongxiang Xia, Xiang Zhou, Xi Chen. Robustness of Power Grids Based on a Probability Model of Node Failures. In IEEE International Symposium on Circuits and Systems, ISCAS 2019, Sapporo, Japan, May 26-29, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.