Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen. Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectronics Reliability, 54(11):2629-2640, 2014. [doi]
@article{JiaoFW14,
title = {Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection},
author = {Jiajia Jiao and Yuzhuo Fu and Shi-Jie Wen},
year = {2014},
doi = {10.1016/j.microrel.2014.06.008},
url = {http://dx.doi.org/10.1016/j.microrel.2014.06.008},
researchr = {https://researchr.org/publication/JiaoFW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {11},
pages = {2629-2640},
}