Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection

Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen. Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectronics Reliability, 54(11):2629-2640, 2014. [doi]

Abstract

Abstract is missing.