Shi-jie. Ageing condition inspection system for electrical contact based on micro-current contact resistance trend tracker. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 613-616, IEEE, 2011. [doi]
@inproceedings{Jie11-1,
title = {Ageing condition inspection system for electrical contact based on micro-current contact resistance trend tracker},
author = {Shi-jie},
year = {2011},
doi = {10.1109/EMEIT.2011.6023176},
url = {http://dx.doi.org/10.1109/EMEIT.2011.6023176},
researchr = {https://researchr.org/publication/Jie11-1},
cites = {0},
citedby = {0},
pages = {613-616},
booktitle = {International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011},
publisher = {IEEE},
isbn = {978-1-61284-087-1},
}