A Novel MCT Focal Plane Array Thermally Stressed at Low Temperatures

Jorge Jiménez, Cristobal Padilla, Antoni Grau. A Novel MCT Focal Plane Array Thermally Stressed at Low Temperatures. IEEE T. Instrumentation and Measurement, 72:1-7, 2023. [doi]

Authors

Jorge Jiménez

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Cristobal Padilla

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Antoni Grau

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