A Novel MCT Focal Plane Array Thermally Stressed at Low Temperatures

Jorge Jiménez, Cristobal Padilla, Antoni Grau. A Novel MCT Focal Plane Array Thermally Stressed at Low Temperatures. IEEE T. Instrumentation and Measurement, 72:1-7, 2023. [doi]

@article{JimenezPG23,
  title = {A Novel MCT Focal Plane Array Thermally Stressed at Low Temperatures},
  author = {Jorge Jiménez and Cristobal Padilla and Antoni Grau},
  year = {2023},
  doi = {10.1109/TIM.2023.3260264},
  url = {https://doi.org/10.1109/TIM.2023.3260264},
  researchr = {https://researchr.org/publication/JimenezPG23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-7},
}