A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals - researchr publication authors

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Le Jin, Degang Chen, Randall L. Geiger. A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 1378-1381, IEEE, 2005. [doi]

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