Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion - researchr publication authors

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Ming Jin, Fujin Deng, Chengkai Liu, Qiang Yu, Jifeng Zhao, Qingsong Wang. Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion. In The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020. pages 5302-5307, IEEE, 2020. [doi]

This author has not been identified. Look up 'Ming Jin' in GoogleThis author has not been identified. Look up 'Fujin Deng' in GoogleThis author has not been identified. Look up 'Chengkai Liu' in GoogleThis author has not been identified. Look up 'Qiang Yu' in GoogleThis author has not been identified. Look up 'Jifeng Zhao' in GoogleThis author has not been identified. Look up 'Qingsong Wang' in Google

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