Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion

Ming Jin, Fujin Deng, Chengkai Liu, Qiang Yu, Jifeng Zhao, Qingsong Wang. Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion. In The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020. pages 5302-5307, IEEE, 2020. [doi]

Abstract

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