Song Jin, Yinhe Han, Huawei Li, Xiaowei Li 0001. Unified Capture Scheme for Small Delay Defect Detection and Aging Prediction. IEEE Trans. VLSI Syst., 21(5):821-833, 2013. [doi]
@article{JinHL013,
title = {Unified Capture Scheme for Small Delay Defect Detection and Aging Prediction},
author = {Song Jin and Yinhe Han and Huawei Li and Xiaowei Li 0001},
year = {2013},
doi = {10.1109/TVLSI.2012.2197766},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2197766},
researchr = {https://researchr.org/publication/JinHL013},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {5},
pages = {821-833},
}