Morn Jin, Wenwen He, John Qiao, Wei-Ting Kary Chien, Shirley Zhao. Wafer level package wafer probing shift error-proof quality control. In 2015 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015, Singapore, December 6-9, 2015. pages 939-942, IEEE, 2015. [doi]
Abstract is missing.