David Jin, Ariel Kapusta, Patrick Minot, Niels H. Olson, Joseph H. Rosenthal, Jansen N. Seheult, Michelle Stram. A Hazard-Aware Metric for Ordinal Multi-Class Classification in Pathology. In Christopher W. Geib, Ron P. A. Petrick, editors, Proceedings of the 2023 AAAI Fall Symposia, Arlington, Virginia, USA, October 25-27, 2023. pages 236-238, AAAI Press, 2023. [doi]
Abstract is missing.