Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems

Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary. Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems. IEEE T. Instrumentation and Measurement, 52(6):1713-1721, 2003. [doi]

Abstract

Abstract is missing.