Jionghua Jin, Jianjun Shi. Automatic feature extraction of waveform signals for in-process diagnostic performance improvement. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 4716-4721, IEEE, 1998. [doi]
@inproceedings{JinS98-1,
title = {Automatic feature extraction of waveform signals for in-process diagnostic performance improvement},
author = {Jionghua Jin and Jianjun Shi},
year = {1998},
doi = {10.1109/ICSMC.1998.727597},
url = {https://doi.org/10.1109/ICSMC.1998.727597},
researchr = {https://researchr.org/publication/JinS98-1},
cites = {0},
citedby = {0},
pages = {4716-4721},
booktitle = {Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998},
publisher = {IEEE},
isbn = {0-7803-4778-1},
}