A Novel Dual Direction SCR With Dummy Gate Structure for High Voltage ESD Protection

Xiangliang Jin, Yang Wang. A Novel Dual Direction SCR With Dummy Gate Structure for High Voltage ESD Protection. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, October 26-30, 2018. pages 443-446, IEEE, 2018. [doi]

Abstract

Abstract is missing.