Comparative study of electro-thermal characteristics of 4500 V diffusion-CS IGBT and buried-CS IGBT

Rui Jin, Yaohua Wang, Li Li, Longlai Xu, Kui Pu, Jun Zeng, Mohamed Darwish. Comparative study of electro-thermal characteristics of 4500 V diffusion-CS IGBT and buried-CS IGBT. IET Circuits, Devices & Systems, 15(3):251-259, 2021. [doi]

Abstract

Abstract is missing.