Testing of a 32-bit High Performance Embedded Microprocessor

Wang Jing, Shengbing Zhang, Zhang Meng. Testing of a 32-bit High Performance Embedded Microprocessor. In IEEE Second International Symposium on Industrial Embedded Systems - SIES 2007, Hotel Costa da Caparica, Lisbon, Portugal, 4-6 July 2007. pages 288-292, IEEE, 2007. [doi]

Abstract

Abstract is missing.