Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Xiao-Yuan Jing, Fei Wu, Xiwei Dong, Fumin Qi, Baowen Xu. Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning. In Elisabetta Di Nitto, Mark Harman, Patrick Heymans, editors, Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering, ESEC/FSE 2015, Bergamo, Italy, August 30 - September 4, 2015. pages 496-507, ACM, 2015. [doi]

This author has not been identified. Look up 'Xiao-Yuan Jing' in GoogleThis author has not been identified. Look up 'Fei Wu' in GoogleThis author has not been identified. Look up 'Xiwei Dong' in GoogleThis author has not been identified. Look up 'Fumin Qi' in GoogleThis author has not been identified. Look up 'Baowen Xu' in Google

runs on WebDSL