Xiao-Yuan Jing, Fei Wu, Xiwei Dong, Fumin Qi, Baowen Xu. Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning. In Elisabetta Di Nitto, Mark Harman, Patrick Heymans, editors, Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering, ESEC/FSE 2015, Bergamo, Italy, August 30 - September 4, 2015. pages 496-507, ACM, 2015. [doi]
Abstract is missing.